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Proceedings Paper

Accuracy of whole-field mapping by Jones matrix Fourier photopolarimeter
Author(s): S. Y. Berezhna; I. V. Berezhnyi; Masahisa Takashi; Arkady S. Voloshin
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Paper Abstract

A whole-field polarimetric method through digital image processing has been developed for mapping the three optical parameters, which determine normalized Jones matrix of an elliptic retarder. The suggested technique conveys measurement data sufficient to describe optical anisotropy in the media exhibiting rotation of birefringence axes along the light path. Particularly, homogeneous or inhomogeneous birefringent gyrotropic objects and initially isotropic transparent samples bearing stress-induced anisotropy can be investigated by use of this technique. Operational principle of the method implies incremental rotation of polarizer and analyzer with the ratio 1:3 over the revolution of the polarizer and collection of 9 intensity images between successive rotation steps. Then thus obtained intensity patterns are digitally processed by use of Fourier analysis. Specifically in this paper we address issues concerning the accuracy of mapping all the three parameters at different values of those. Some ad hoc experiments with test crystalline quartz phase plates are reported. Computer simulations and measurement results are presented and discussed.

Paper Details

Date Published: 14 June 2000
PDF: 9 pages
Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); doi: 10.1117/12.388427
Show Author Affiliations
S. Y. Berezhna, Institute for Physical Optics (Ukraine)
I. V. Berezhnyi, Institute for Physical Optics (Ukraine)
Masahisa Takashi, Aoyama Gakuin Univ. (Japan)
Arkady S. Voloshin, Lehigh Univ. (United States)

Published in SPIE Proceedings Vol. 4148:
Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing
Simon B. Gurevich; Zinovii T. Nazarchuk; Leonid I. Muravsky, Editor(s)

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