Share Email Print

Proceedings Paper

Patterning of hyperbranched resist materials by e-beam
Author(s): Alexander R. Trimble; David C. Tully; Jean M. J. Frechet; David R. Medeiros; Marie Angelopoulos
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The application of a hyperbranched polymer with its globular architecture as a chemically amplified resist system is demonstrated. These hyperbranched poly(esters) based on 3,5- dihydroxybenzoic acid and 4,4-bis(4-hydroxyphenyl)valeric acid and obtained by a polycondensation process at high temperatures. Once obtained, the hyperbranched polymers are functionalized with acid and thermally labile t-BOC groups by reaction of their phenolic groups with di-t-butyl dicarbonate in the presence of a catalytic amount of potassium t-butoxide. These globular materials have number average molecular weights (Mn) in the range of 5,000 - 20,000 with polydispersities of 1.5 - 2. Exposure of the hyperbranched resist material formulated with a photoacid generator was carried out using a direct-write electron-beam (e-beam) tool operating at 50 keV with doses of 15 - 40 (mu) C/cm2. Development of these resist materials can be accomplished in either aqueous base developer or organic solvent, thereby allowing access to both the positive and negative tone images. Feature sizes of 100 nm are readily obtained from these unoptimized materials.

Paper Details

Date Published: 23 June 2000
PDF: 4 pages
Proc. SPIE 3999, Advances in Resist Technology and Processing XVII, (23 June 2000); doi: 10.1117/12.388286
Show Author Affiliations
Alexander R. Trimble, Univ. of California/Berkeley (United States)
David C. Tully, Univ. of California/Berkeley (United States)
Jean M. J. Frechet, Univ. of California/Berkeley (United States)
David R. Medeiros, IBM Thomas J. Watson Research Ctr. (United States)
Marie Angelopoulos, IBM Thomas J. Watson Research Ctr. (United States)

Published in SPIE Proceedings Vol. 3999:
Advances in Resist Technology and Processing XVII
Francis M. Houlihan, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?