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Proceedings Paper

Diffraction investigations by use of Kumakhov lenses
Author(s): Nariman S. Ibraimov; Svetlana V. Nikitina; Kirill N. Lopurko
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Paper Abstract

Main optical characteristics of Kumakhov x-ray systems (lenses, halflenses) were studied by means of coordinate metrological stand. Angular convergence and divergence of radiation, diffraction reflection of x-ray beams from monochromator versus angular divergence of halflenses have been investigated.

Paper Details

Date Published: 8 June 2000
PDF: 7 pages
Proc. SPIE 4155, Kumakhov Optics and Application, (8 June 2000); doi: 10.1117/12.387871
Show Author Affiliations
Nariman S. Ibraimov, Institute for Roentgen Optics (Russia)
Svetlana V. Nikitina, Institute for Roentgen Optics (Russia)
Kirill N. Lopurko, Institute for Roentgen Optics (Russia)

Published in SPIE Proceedings Vol. 4155:
Kumakhov Optics and Application
Muradin A. Kumakhov, Editor(s)

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