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Proceedings Paper

Preparation of polyperinaphthalenic organic semiconductor thin films by excimer laser ablation and application to anode electrodes for ultrathin rechargable lithium ion batteries
Author(s): Satoru Nishio; Sigenori Kuriki; Yukari Tsujine; Akiyoshi Matsuzaki; Hiroyasu Sato; Nobuo Ando; Yukinori Hato; Kazuyoshi Tanaka
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Paper Abstract

Amorphous organic semiconductor thin films are prepared on temperature-controlled substrates by excimer laser ablation (ELA) of 3, 4, 9, 10-perylenetetracarboxylic dianhydride (PTCDA) or PTCDA/Co mixture target with a 308(XeCl) pulsed excimer laser beam. Drastic increase in conductivity was observed along with decrease in the IR peak intensities related to the side groups of PTCDA monomers for films prepared on substrates above 200°C. Electric conductivity of a film prepared on a substrate at 300°C comes up to 10-1Scm-1. Although carbon radicals are detected to some extent, indicating incomplete polymerization. Raman spectroscopic measurement reveals that this film basically consists of polyperinaphthalene (PPN) structure. This material is named polyperinaphthlenic organic semiconductor (PPNOS). ELA of mixture target of PTCDA and Co enables us to obtain PPNOS at room temperature. Electrochemical doping of PPNOS films with lithium ion suggests the passable performance of this film as anode electrodes of ultra thin rechargeable lithium ion batteries.

Paper Details

Date Published: 7 June 2000
PDF: 9 pages
Proc. SPIE 3933, Laser Applications in Microelectronic and Optoelectronic Manufacturing V, (7 June 2000);
Show Author Affiliations
Satoru Nishio, Mi'e Univ. (Japan)
Sigenori Kuriki, Mi'e Univ. (Japan)
Yukari Tsujine, Mi'e Univ. (Japan)
Akiyoshi Matsuzaki, Mi'e Univ. (Japan)
Hiroyasu Sato, Mi'e Univ. (Japan)
Nobuo Ando, Kanebo Ltd. (Japan)
Yukinori Hato, Kanebo Ltd. (Japan)
Kazuyoshi Tanaka, Kyoto Univ. (Japan)

Published in SPIE Proceedings Vol. 3933:
Laser Applications in Microelectronic and Optoelectronic Manufacturing V
Henry Helvajian; Koji Sugioka; Malcolm C. Gower; Jan J. Dubowski, Editor(s)

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