
Proceedings Paper
Programmable resolution imager for imaging applicationsFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper a programmable imager with averaging capabilities will be described which is intended for averaging of different groups or sets of pixels formed by n X n kernels, n X m kernels or any group of randomly- selected pixels across the array. This imager is a 64 X 64 array which uses passive pixels with electronic shutter and anti-blooming structure that can be randomly accessed. The read-out stage includes a sole charge amplifier with programmable gain, a sample-and-hold structure and an analog buffer. This read-out structure is different from other existing imagers with variable resolution since it uses a sole charge amplifier, whereas the conventional structure employs an opamp per column plus another global opamp. this architecture allows a reduction of the fixed-pattern noise observed in standard imagers. The prototype also includes an analog to digital converter which provides the digital output of the images.
Paper Details
Date Published: 15 May 2000
PDF: 10 pages
Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); doi: 10.1117/12.385431
Published in SPIE Proceedings Vol. 3965:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
Morley M. Blouke; Nitin Sampat; Thomas Yeh; Nitin Sampat; George M. Williams Jr.; Thomas Yeh, Editor(s)
PDF: 10 pages
Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); doi: 10.1117/12.385431
Show Author Affiliations
Elisenda Roca, Ctr. Nacional de Microelectronica (Spain)
German Soriano, Ctr. Nacional de Microelectronica (Spain)
Servando Espejo, Ctr. Nacional de Microelectronica and Univ. de Sevilla (Spain)
German Soriano, Ctr. Nacional de Microelectronica (Spain)
Servando Espejo, Ctr. Nacional de Microelectronica and Univ. de Sevilla (Spain)
Rafael Dominguez-Castro, Ctr. Nacional de Microelectronica and Univ. de Sevilla (Spain)
Gustavo Linan, Ctr. Nacional de Microelectronica (Spain)
Angel Rodriguez-Vazquez, Ctr. Nacional de Microelectronica and Univ. de Sevilla (Spain)
Gustavo Linan, Ctr. Nacional de Microelectronica (Spain)
Angel Rodriguez-Vazquez, Ctr. Nacional de Microelectronica and Univ. de Sevilla (Spain)
Published in SPIE Proceedings Vol. 3965:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
Morley M. Blouke; Nitin Sampat; Thomas Yeh; Nitin Sampat; George M. Williams Jr.; Thomas Yeh, Editor(s)
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