
Proceedings Paper
Improvement of image quality in CR mammography by detection of emissions from dual sides of an imaging plateFormat | Member Price | Non-Member Price |
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Paper Abstract
We developed a high resolution Imaging Plate (IP) with a transparent support and a reading system that can detect emissions from dual sides of the IP to improve the image quality of the CR mammography. And we proposed an addition method using the filtering processing in real space in order to achieve optimum addition in all the spatial frequencies. The image quality of the system was evaluated by NEQ and CD- MAM phantom. Furthermore we separated the noise component that consisted of X-ray photon noise, light photon noise, and the structural noise of the IP utilizing laser power dependency of the amount of emissions and the Wiener Spectrum. By using the above reading system and the addition method, NEQ of the system was improved by 40% - 50% compared to the latest CR mammography system. We confirmed by use of CD-MAM that the detectability of the image in this reading system was remarkably improved. The noise analysis showed that the ratios of the light photon noise at 1c/mm of the front side image and the back side image were about 15% and 40%, respectively, and according as the spatial frequency became higher the ratio of the light photon noise increased.
Paper Details
Date Published: 25 April 2000
PDF: 11 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384536
Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)
PDF: 11 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384536
Show Author Affiliations
Katsuhiro Kohda, Fuji Photo Film Co., Ltd. (Japan)
Toshiaki Suzuki, Fuji Photo Film Co., Ltd. (Japan)
Toshiaki Suzuki, Fuji Photo Film Co., Ltd. (Japan)
Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)
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