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Proceedings Paper

Solid state VRX CT detector
Author(s): Frank A. DiBianca; Roman Melnyk; Aniket Sambari; Lawrence M. Jordan; Joseph S. Laughter; Ping Zou
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Paper Abstract

A technique called Variable-Resolution X-ray (VRX) detection that greatly increases the spatial resolution in computed tomography (CT) and digital radiography (DR) is presented. The technique is based on a principle called 'projective compression' that allows the resolution element of a CT detector to scale with the subject or field size. For very large (40 - 50 cm) field sizes, resolution exceeding 2 cy/mm is possible and for very small fields, microscopy is attainable with resolution exceeding 100 cy/mm. Preliminary results from a 576-channel solid-state detector are presented. The detector has a dual-arm geometry and is comprised of CdWO4 scintillator crystals arranged in 24 modules of 24 channels/module. The scintillators are 0.85 mm wide and placed on 1 mm centers. Measurements of signal level, MTF and SNR, all versus detector angle, are presented.

Paper Details

Date Published: 25 April 2000
PDF: 6 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384494
Show Author Affiliations
Frank A. DiBianca, Univ. of Tennessee/Memphis (United States)
Roman Melnyk, Univ. of Tennessee/Memphis (United States)
Aniket Sambari, Univ. of Tennessee/Memphis (United States)
Lawrence M. Jordan, Univ. of Tennessee/Memphis (United States)
Joseph S. Laughter, Univ. of Tennessee/Memphis (United States)
Ping Zou, Univ. of Tennessee/Memphis (United States)

Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)

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