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Proceedings Paper

Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy
Author(s): Noel Axelrod; Anna Radko; Nissim Ben-Yosef; Artium Khatchatouriants; Millet Treinin; Aaron Lewis
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Paper Abstract

We demonstrate that near-field optical and atomic force microscopy data can be used for super-resolution 3D image restoration in optical sectioning fluorescence microscopy. A crucial feature in this approach is the full integration of such data sets with digital far-field images. The scanned probe data is used to provide modalities for boundary constraints which define surface optical information and spatial domains of optical alterations in a sample with a spatial precision that has been unachievable in the past. A restoration algorithm that can use such a complex of data for 3D image deconvolution is presented. It uses a Tikhonov- Miller regularization scheme and allows for the imposition of different types of constraints to obtain super-resolution deconvolved images. Performance was tested by using simulated 3D imaging. An example is given of the restoration of a 3D wide field optical image of a biological specimen in the presence of atomic force constraints.

Paper Details

Date Published: 2 May 2000
PDF: 11 pages
Proc. SPIE 3919, Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII, (2 May 2000); doi: 10.1117/12.384191
Show Author Affiliations
Noel Axelrod, Hebrew Univ. of Jerusalem (Israel)
Anna Radko, Hebrew Univ. of Jerusalem (Israel)
Nissim Ben-Yosef, Hebrew Univ. of Jerusalem (Israel)
Artium Khatchatouriants, Hebrew Univ. of Jerusalem (Israel)
Millet Treinin, Hebrew Univ. of Jerusalem (Israel)
Aaron Lewis, Hebrew Univ. of Jerusalem (Israel)

Published in SPIE Proceedings Vol. 3919:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII
Jose-Angel Conchello; Carol J. Cogswell; Andrew G. Tescher; Tony Wilson, Editor(s)

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