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Proceedings Paper

Substrate-removed 850-nm RCLEDs and small core (63/125 um) plastic optical fibers for optical data communication
Author(s): Thierry Coosemans; Ronny Bockstaele; An Van Hove; Kris Naessens; Joff Derluyn; Luc Vanwassenhove; Peter Van Daele; Ingrid Moerman; Roel G. Baets
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Paper Abstract

Current developments in computer technology give rise to increasing data communication over relatively short distances at backplane- and inter MCM interconnect level. It is foreseen that electrical interconnect will not be able to accommodate the necessary data traffic in advanced data processing systems in the future and hence a bottleneck will be created. A potential remedy for this interconnect problem is the use of parallel optical datalinks. In this paper we propose small diameter step index plastic optical fiber ribbons in combination with high efficient resonant cavity LED's as a cheap and feasible option for these optical links. A design for such an optical link is presented with special attention for the optical pathway. Experimental results on the optical properties of the used POF are shown. We describe the development of RCLED's at 850 nm specially designed for efficient coupling into POF. We measured a RCLED to POF coupling efficiency up to 40%. Additionally we report on the technologies used for the fabrication and assembly of the optical pathways and finally some experiments were carried out on the first realized assemblies.

Paper Details

Date Published: 17 April 2000
PDF: 9 pages
Proc. SPIE 3938, Light-Emitting Diodes: Research, Manufacturing, and Applications IV, (17 April 2000);
Show Author Affiliations
Thierry Coosemans, IMEC (Belgium)
Ronny Bockstaele, IMEC (Belgium)
An Van Hove, IMEC (Belgium)
Kris Naessens, IMEC (Belgium)
Joff Derluyn, IMEC (Belgium)
Luc Vanwassenhove, IMEC (Belgium)
Peter Van Daele, IMEC (Belgium)
Ingrid Moerman, IMEC (Belgium)
Roel G. Baets, IMEC (Belgium)

Published in SPIE Proceedings Vol. 3938:
Light-Emitting Diodes: Research, Manufacturing, and Applications IV
H. Walter Yao; Ian T. Ferguson; E. Fred Schubert, Editor(s)

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