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Proceedings Paper

New approach for logo recognition
Author(s): Jingying Chen; Maylor K. H. Leung; Yongsheng Gao
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Paper Abstract

The problem of logo recognition is of great interest in the document domain, especially for document database. By recognizing the logo we obtain semantic information about the document which may be useful in deciding whether or not to analyze the textual components. In order to develop a logo recognition method that is efficient to compute and product intuitively reasonable results, we investigate the Line Segment Hausdorff Distance on logo recognition. Researchers apply Hausdorff Distance to measure the dissimilarity of two point sets. It has been extended to match two sets of line segments. The new approach has the advantage to incorporate structural and spatial information to compute the dissimilarity. The added information can conceptually provide more and better distinctive capability for recognition. The proposed technique has been applied on line segments of logos with encouraging results that support the concept experimentally. This might imply a new way for logo recognition.

Paper Details

Date Published: 31 March 2000
PDF: 8 pages
Proc. SPIE 4043, Optical Pattern Recognition XI, (31 March 2000); doi: 10.1117/12.381603
Show Author Affiliations
Jingying Chen, Nanyang Technological Univ. (Singapore)
Maylor K. H. Leung, Nanyang Technological Univ. (Singapore)
Yongsheng Gao, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 4043:
Optical Pattern Recognition XI
David P. Casasent; Tien-Hsin Chao, Editor(s)

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