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Proceedings Paper

Full-face full-complex characterization of a reflective SLM
Author(s): Richard D. Juday; John Michael Rollins; Stanley E. Monroe Jr.; Michael V. Morelli
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Paper Abstract

We report algorithms and laboratory practices that tell the full complex behavior of an SLM over its entire face, pixel by pixel, and put the information into a form that is useful to our filter optimization code. We add a quadrature component to the interferometry and image each pixel of the SLM. We analyze the fringes not at one value of drive and in an across-pixels dimension, but instead at each pixel in the drive dimension. We describe details of the method and given examples of spatially-variant filter SLM behavior. We provide examples of performance degradation when the filter's spatial variance has not been accommodated.

Paper Details

Date Published: 31 March 2000
PDF: 10 pages
Proc. SPIE 4043, Optical Pattern Recognition XI, (31 March 2000); doi: 10.1117/12.381582
Show Author Affiliations
Richard D. Juday, NASA Johnson Space Ctr. (United States)
John Michael Rollins, Hernandez Engineering (United States)
Stanley E. Monroe Jr., Lockheed Martin Space Operations (United States)
Michael V. Morelli, Siros Technologies (United States)

Published in SPIE Proceedings Vol. 4043:
Optical Pattern Recognition XI
David P. Casasent; Tien-Hsin Chao, Editor(s)

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