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Proceedings Paper

Calibrated thermal microscopy of the tool-chip interface in machining
Author(s): Howard W. Yoon; Matthew A. Davies; Timothy J. Burns; M. D. Kennedy
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Paper Abstract

A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction-limited thermal-imaging microscope to measure the spatially-resolved temperatures during the machining of an AISI 1045 steel with a tungsten-carbide tool bit. The microscope has a target area of 0.5 mm X 0.5 mm square region with a < 5 micrometers spatial resolution and is based on a commercial InSb 128 X 128 focal plane array with an all reflective microscope objective. The minimum frame image acquisition time is < 1 ms. The microscope is calibrated using a standard blackbody source from the radiance temperature calibration laboratory at the National Institute of Standards and Technology, and the emissivity of the machined material is deduced from the infrared reflectivity measurements. The steady-state thermal images from the machining of 1045 steel are compared to previous determinations of tool temperatures from micro-hardness measurements and are found to be in agreement with those studies. The measured average chip temperatures are also in agreement with the temperature rise estimated from energy balance considerations. From these calculations and the agreement between the experimental and the calculated determinations of the emissivity of the 1045 steel, the standard uncertainty of the temperature measurements is estimated to be about 45 degree(s)C at 900 degree(s)C.

Paper Details

Date Published: 30 March 2000
PDF: 11 pages
Proc. SPIE 4020, Thermosense XXII, (30 March 2000); doi: 10.1117/12.381557
Show Author Affiliations
Howard W. Yoon, National Institute of Standards and Technology (United States)
Matthew A. Davies, National Institute of Standards and Technology (United States)
Timothy J. Burns, National Institute of Standards and Technology (United States)
M. D. Kennedy, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 4020:
Thermosense XXII
Ralph B. Dinwiddie; Dennis H. LeMieux, Editor(s)

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