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Proceedings Paper

Microphotoluminescence mapping of packaging-induced stress distribution in high-power AlGaAs laser diodes
Author(s): Pilar Martin; Jean-Pierre Landesman; Esther Martin; A. Fily; Jean-Pierre Hirtz; Renato Bisaro
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Paper Abstract

Spatially resolved photo-luminescence (PL) line-scans were performed in a specific optical micro-probe to determine the soldering-induced local stresses in GaAs/GaAlAs laser diode arrays designed for high-power operation at 808 nm. In this approach, the sign and magnitude of the local stress are deduced from the spectral shift associated with band-to-band transitions in the GaAs substrate. The sensitivity (minimal equivalent hydrostatic stress that can be detected) is better than 10 MPa. The spatial resolution of the micro-PL technique (of the order of 1 micrometer), together with the short acquisition times, allows for detailed investigations of the stress profiles along the whole laser bars with a large number of data points. Different aspects of the mechanical stress distribution at the various steps of the process could thus be revealed. Finally, correlations between solder-induced stress distribution and estimated lifetimes were established. In particular, << V-shaped >> defects, which are known as a failure mechanism on this type of devices, were observed only on the laser bars for which the micro-PL indicates the strongest compressive stress. This leads to consider the micro-PL approach proposed here as a cost- effective screening technique for the high-power GaAs/GaAlAs laser diode arrays.

Paper Details

Date Published: 29 March 2000
PDF: 9 pages
Proc. SPIE 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V, (29 March 2000); doi: 10.1117/12.380548
Show Author Affiliations
Pilar Martin, Thomson-CSF (France)
Jean-Pierre Landesman, Thomson-CSF (France)
Esther Martin, Thomson-CSF (France)
A. Fily, Thomson-CSF (France)
Jean-Pierre Hirtz, Thomson-CSF (France)
Renato Bisaro, Thomson-CSF (France)


Published in SPIE Proceedings Vol. 3945:
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
Geoffrey T. Burnham; S. C. Wang; Geoffrey T. Burnham; Xiaoguang He; Kurt J. Linden; S. C. Wang, Editor(s)

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