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Proceedings Paper

Accommodating multiple illumination sources in an imaging colorimetry environment
Author(s): Kenneth W. Tobin Jr.; James S. Goddard Jr.; Martin A. Hunt; Kathy W. Hylton; Thomas P. Karnowski; Marc L. Simpson; Roger K. Richards; Dale A. Treece
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Paper Abstract

Researchers at the Oak Ridge National Laboratory have been developing a method for measuring color quality in textile products using a tri-stimulus color camera system. Initial results of the Imaging Tristimulus Colorimeter (ITC) were reported during 1999. These results showed that the projection onto convex sets (POCS) approach to color estimation could be applied to complex printed patterns on textile products with high accuracy and repeatability. Image-based color sensors used for on-line measurement are not colorimetric by nature and require a non-linear transformation of the component colors based on the spectral properties of the incident illumination, imaging sensor, and the actual textile color. Our earlier work reports these results for a broad-band, smoothly varying D65 standard illuminant. To move the measurement to the on-line environment with continuously manufactured textile webs, the illumination source becomes problematic. The spectral content of these light sources varies substantially from the D65 standard illuminant and can greatly impact the measurement performance of the POCS system. Although absolute color measurements are difficult to make under different illumination, referential measurements to monitor color drift provide a useful indication of product quality. Modifications to the ITC system have been implemented to enable the study of different light sources. These results and the subsequent analysis of relative color measurements will be reported for textile products.

Paper Details

Date Published: 21 March 2000
PDF: 12 pages
Proc. SPIE 3966, Machine Vision Applications in Industrial Inspection VIII, (21 March 2000); doi: 10.1117/12.380073
Show Author Affiliations
Kenneth W. Tobin Jr., Oak Ridge National Lab. (United States)
James S. Goddard Jr., Oak Ridge National Lab. (United States)
Martin A. Hunt, Oak Ridge National Lab. (United States)
Kathy W. Hylton, Oak Ridge National Lab. (United States)
Thomas P. Karnowski, Oak Ridge National Lab. (United States)
Marc L. Simpson, Oak Ridge National Lab. (United States)
Roger K. Richards, Oak Ridge National Lab. (United States)
Dale A. Treece, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 3966:
Machine Vision Applications in Industrial Inspection VIII
Kenneth W. Tobin Jr.; John C. Stover, Editor(s)

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