Share Email Print

Proceedings Paper

Nondestructive analysis of artifacts
Author(s): Manfred Schreiner
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The development of non-destructive material analysis in the field of art and archaeology is described briefly and the applicability of x-ray fluorescence analysis (XRF) to artifacts is discussed. A new instrument based on energy dispersive XRF built at the Academy of Fine Arts in Vienna enables the analysis of large objects, e.g. easel paintings up to 2 X 3 without taking original sample material.

Paper Details

Date Published: 16 March 2000
PDF: 9 pages
Proc. SPIE 3851, Scientific Detection of Fakery in Art II, (16 March 2000); doi: 10.1117/12.379870
Show Author Affiliations
Manfred Schreiner, Academy of Fine Arts Vienna (Austria) and Vienna Univ. of Technology (Austria)

Published in SPIE Proceedings Vol. 3851:
Scientific Detection of Fakery in Art II
Duane R. Chartier; Walter McCrone; Richard J. Weiss, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?