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Proceedings Paper

ODIF for stack filters
Author(s): Sari Peltonen; Pauli Kuosmanen
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Paper Abstract

In this paper we study robustness of stack filters by using a recently introduced method called output distributional influence function (ODIF). Unlike the traditionally used methods, such as the influence function and the change-of- variance function, the ODIF provides information about the robustness of finite length filters. So the ODIF is not only a good theoretical analysis tool but it can also be used in real filtering situations for selecting filters behaving as desired in the presence of contamination. We present the ODIFs for the independent but not identically distributed inputs which can be used, e.g., to study the robustness against outliers in linearly increasing or decreasing signals. For independent and identically distributed inputs there are three practical expressions for the output distribution of a stack filter and thus for that case we present three alternative expressions also for the ODIFs. The usefulness of the ODIF in the analysis of the robustness of different stack filters is demonstrated in several illustrative examples by using the ODIFs for the expectation and the variance giving local robustness of the value and the variance, respectively. We also present how to obtain in a straightforward manner the ODIFs for the duals of the stack filters.

Paper Details

Date Published: 3 March 2000
PDF: 10 pages
Proc. SPIE 3961, Nonlinear Image Processing XI, (3 March 2000); doi: 10.1117/12.379382
Show Author Affiliations
Sari Peltonen, Tampere Univ. of Technology (Finland)
Pauli Kuosmanen, Tampere Univ. of Technology (Finland)

Published in SPIE Proceedings Vol. 3961:
Nonlinear Image Processing XI
Edward R. Dougherty; Jaakko T. Astola, Editor(s)

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