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Proceedings Paper

Microstructural characterization of inhomogeneous media
Author(s): Aristide C. Dogariu
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Paper Abstract

The need for microstructural characterization extends beyond defect detection and control of fabrication processes. Accurate description of the dielectric properties is required to predict the macroscopic properties of heterogeneous or composite materials and to implement materials-by-design concepts. Traditionally, light scattering has been the tool of choice because of its noninvasive character. However, many forms of condensed matter scatter light very strongly and complications due to multiple scattering seem to prevent the direct use of such investigation methods. Recent advances in the theory of multiple light scattering show that retrieval of structural information is possible in spite of an overall randomness of the scattered field. We developed the phenomenological understanding and the methodologies necessary to correlate the morphological details of the scattering centers with the measurable macroscopic properties.

Paper Details

Date Published: 3 March 2000
PDF: 12 pages
Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); doi: 10.1117/12.379334
Show Author Affiliations
Aristide C. Dogariu, CREOL/Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 3902:
Laser-Induced Damage in Optical Materials: 1999
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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