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Proceedings Paper

Electron tunnel ionization: the pulse length and wavelength dependence
Author(s): Jerry Ray Bettis
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Paper Abstract

An extension of the Keldysh formulation for electron tunnel ionization has resulted in a description of laser-induced dielectric breakdown with the following features: threshold optical field is predictive based on material properties such as ionization potential, number density, and refractive index. Time to damage is predicted to occur at or slightly beyond the peak laser intensity. Threshold breakdown fields depend on gas pressure as p-1/3. Threshold field varies with pulse duration as t-1/4. The perceived anomalously high strong-field ionization rate of O2 as compared to Xe is explained. Acceptable agreement with measured threshold is seen for a range of materials with 0.000036 < n - 1 < 1.4, and threshold field varies approximately as (Lambda) 0.77 for 0.248 micrometers < 1 < 2.94 micrometers . Specific pulse shapes can be simulated and their effects predicted.

Paper Details

Date Published: 3 March 2000
PDF: 15 pages
Proc. SPIE 3902, Laser-Induced Damage in Optical Materials: 1999, (3 March 2000); doi: 10.1117/12.379295
Show Author Affiliations
Jerry Ray Bettis, Boeing Co. (United States)

Published in SPIE Proceedings Vol. 3902:
Laser-Induced Damage in Optical Materials: 1999
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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