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Proceedings Paper

Beam-deflection study of shock wave formation during pulsed UV laser surface treatment of C60 films
Author(s): Qihong Lou
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Paper Abstract

Beam-deflection technique was used to monitor the surface treatment of fullerence films near the ablation threshold region. When the fullerence films were irradiated by UV excimer laser with fluence below the ablation threshold, an increase of the electrical conductivity of up to six orders of magnitude was observed. The products resulting from the laser irradiation have been investigated by Raman spectroscopy.

Paper Details

Date Published: 7 February 2000
PDF: 7 pages
Proc. SPIE 3888, High-Power Lasers in Manufacturing, (7 February 2000); doi: 10.1117/12.377011
Show Author Affiliations
Qihong Lou, Shanghai Institute of Optics and Fine Mechanics (China)

Published in SPIE Proceedings Vol. 3888:
High-Power Lasers in Manufacturing
Xiangli Chen; Tomoo Fujioka; Akira Matsunawa, Editor(s)

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