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Proceedings Paper

Applications of atomic force microscopy to the study of lightguide fibers
Author(s): Charles R. Kurkjian; Osman S. Gebizlioglu; Joel D. Mann
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Paper Abstract

Atomic force microscopy has proven to be of great value in the study of the surface roughness of aged silica fibers. It has been shown that aging in both liquid water and water vapor results in surface roughening which correlates with and is apparently responsible for the strength degradation. In this paper, we show that the application of a new indenting/scratching/imaging tip and associated software allow this tool to be extended to the study of a new range of problems. We illustrate the usefulness of this `nanoindentation/imaging probe' in the study of indents and scratches on silica fiber surfaces which have undergone a variety of treatments as well as in study of coatings on these silica lightguide surfaces.

Paper Details

Date Published: 29 December 1999
PDF: 7 pages
Proc. SPIE 3848, Optical Fiber Reliability and Testing, (29 December 1999); doi: 10.1117/12.372766
Show Author Affiliations
Charles R. Kurkjian, Telcordia Technologies, Inc. (United States)
Osman S. Gebizlioglu, Telcordia Technologies, Inc. (United States)
Joel D. Mann, Telcordia Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 3848:
Optical Fiber Reliability and Testing
M. John Matthewson, Editor(s)

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