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Proceedings Paper

Modification of organic interfaces: from molecular level measurements to injection characteristics
Author(s): Ian G. Hill; D. Milliron; J. Schwartz; Antoine Kahn
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Paper Abstract

Ultra-violet and X-ray photoemission spectroscopy and current- voltage measurements were used to investigate the fundamental mechanisms responsible for the improvement of hole injection between modified indium-tin-oxide (ITO) surfaces and the hole- transport layer (HTL) of an organic light emitting diode. Two ITO surface modification techniques were investigated: oxygen- plasma treatment and deposition of an ultra-thin organic interlayer between the ITO and the HTL. We demonstrate that the improvement in injection is due to an increase in surface work function of ITO mediated by the presence of an oxygen radical in the first case, and to the presence of an intermediate energy level between the ITO Fermi level and the HTL highest occupied molecular orbital in the second.

Paper Details

Date Published: 17 December 1999
PDF: 7 pages
Proc. SPIE 3797, Organic Light-Emitting Materials and Devices III, (17 December 1999); doi: 10.1117/12.372720
Show Author Affiliations
Ian G. Hill, Princeton Univ. (United States)
D. Milliron, Princeton Univ. (United States)
J. Schwartz, Princeton Univ. (United States)
Antoine Kahn, Princeton Univ. (United States)

Published in SPIE Proceedings Vol. 3797:
Organic Light-Emitting Materials and Devices III
Zakya H. Kafafi, Editor(s)

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