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Proceedings Paper

Optical nanoscale investigation of surface characteristics
Author(s): Pavel Tomanek
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Paper Abstract

In the paper some basic optical near field theoretical approaches will be explained as well as the principles of microscope set-ups. Application items as nanoscale topography with lateral superresolution, local spectroscopy of semiconductors, local fluorescence of dielectric films and achieving of higher data density of the recording medium will be also presented.

Paper Details

Date Published: 18 November 1999
PDF: 9 pages
Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370429
Show Author Affiliations
Pavel Tomanek, Brno Univ. of Technology (Czech Republic)


Published in SPIE Proceedings Vol. 3904:
Fourth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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