Proceedings Paper
Fractal structure and light-scattering characteristics of roughly polished glass| Format | Member Price | Non-Member Price |
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Paper Abstract
The spectra of spatial frequencies of roughly polished glass are studied. The profile measurements carried out by means of contact profilometer and a tunnel scanning microscope have shown fractal-like dependence of spatial frequency spectra over the range of more than 1 decade. The parameters of fractal structure determined from measured spatial frequency spectra has been used for calculation of angle dependence of scattered radiation. The comparison between experimentally and theoretically obtained angle dependence of scattered radiation has shown a good agreement with fractal model of scattering surface.
Paper Details
Date Published: 18 November 1999
PDF: 6 pages
Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370420
Published in SPIE Proceedings Vol. 3904:
Fourth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)
PDF: 6 pages
Proc. SPIE 3904, Fourth International Conference on Correlation Optics, (18 November 1999); doi: 10.1117/12.370420
Show Author Affiliations
Ivan A. Popov, S.I. Vavilov State Optical Institute (Russia)
L. A. Glushchenko, S.I. Vavilov State Optical Institute (Russia)
Nikolay V. Sidorovsky, S.I. Vavilov State Optical Institute (Russia)
L. A. Glushchenko, S.I. Vavilov State Optical Institute (Russia)
Nikolay V. Sidorovsky, S.I. Vavilov State Optical Institute (Russia)
Yury M. Voronin, S.I. Vavilov State Optical Institute (Russia)
Peter P. Maksimyak, Chernivtsi State Univ. (Ukraine)
Peter P. Maksimyak, Chernivtsi State Univ. (Ukraine)
Published in SPIE Proceedings Vol. 3904:
Fourth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)
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