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Proceedings Paper

Acquiring even-striped pattern intensity in three-dimensional shape measurement system using an optical modulator
Author(s): Katsumi Tsujioka; Hideo Furuhashi; Kazuo Hatano; Shuntaro Higa; Yoshiyuki Uchida
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Paper Abstract

We have continued research on our 3D shape measurement system, using spatial projections of light variation patterns. This method is non-contact, non-invasive, and completes measurement in a short time. However, light diffusion influence on the measurable accuracy. We proposed a method using differentiation to enhance accuracy of measurement, and were successful in achieving this goal. Moreover, the measurable area was expanded. Since our method involves computational manipulation of the data obtained by the original system, it requires no additional equipment. It is a very practical and effective method.

Paper Details

Date Published: 16 November 1999
PDF: 8 pages
Proc. SPIE 3835, Three-Dimensional Imaging, Optical Metrology, and Inspection V, (16 November 1999); doi: 10.1117/12.370264
Show Author Affiliations
Katsumi Tsujioka, Fujita Health Univ. (Japan)
Hideo Furuhashi, Aichi Institute of Technology (Japan)
Kazuo Hatano, Aichi Institute of Technology (Japan)
Shuntaro Higa, Aichi Institute of Technology (Japan)
Yoshiyuki Uchida, Aichi Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 3835:
Three-Dimensional Imaging, Optical Metrology, and Inspection V
Kevin G. Harding, Editor(s)

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