
Proceedings Paper
Energy and polarization control in synchrotron-radiation-stimulated nanoprocessFormat | Member Price | Non-Member Price |
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Paper Abstract
Synchrotron radiation (SR) stimulated process, which has characteristics of high spatial resolution and low damage, is suitable for nano-processes. Si(111) surface after removal of native oxide by SR stimulated desorption was atomically flat with no damage. If the semiconductor surface is chemically modified and chemical bonds having a weak interaction with the substrate electronic states (a localized electronic state) are formed, for example, such as SiH2 and SiH3, they can be broken (etched) by the SR irradiations. Efficient site specific bone breaking, overwhelming the secondary electron effects, can be expected by a resonant excitations from a core electronic state to a dissociative valence electron state. The excitation energy and polarization tunability, which is unique characteristic of the SR process, will display its power in the nano-process applications which require the atom level control.
Paper Details
Date Published: 16 November 1999
PDF: 11 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370106
Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)
PDF: 11 pages
Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370106
Show Author Affiliations
Tsuneo Urisu, Institute for Molecular Science (Japan)
Harutaka Mekaru, Institute for Molecular Science (Japan)
Takayuki Miyamae, Institute for Molecular Science (Japan)
Harutaka Mekaru, Institute for Molecular Science (Japan)
Takayuki Miyamae, Institute for Molecular Science (Japan)
Shinya Hirano, Institute for Molecular Science (Japan)
Hideyuki Noda, Institute for Molecular Science (Japan)
Hideyuki Noda, Institute for Molecular Science (Japan)
Published in SPIE Proceedings Vol. 3773:
X-Ray Optics Design, Performance, and Applications
Ali M. Khounsary; Andreas K. Freund; Tetsuya Ishikawa; George Srajer; Jonathan C. Lang, Editor(s)
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