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Proceedings Paper

Full-field stress/birefringence analysis with a polarizing microscope
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Paper Abstract

An automatic method of full-field stress measurement using a transmitting micro-polariscope is proposed. A compact optical transmitting polarizing microscope with white light source is rebuilt by developing a loading and recording system, in order to perform a tension test. Both isoclinics and isochromatics are measured in real-time with phase shifting technique. A new simple algorithm for isochromatics is proposed. It is found to be suitable for the current micro-polariscope.

Paper Details

Date Published: 11 November 1999
PDF: 7 pages
Proc. SPIE 3897, Advanced Photonic Sensors and Applications, (11 November 1999); doi: 10.1117/12.369314
Show Author Affiliations
Anand Krishna Asundi, Nanyang Technological Univ. (Singapore)
Bing Zhao, Nanyang Technological Univ. (United States)

Published in SPIE Proceedings Vol. 3897:
Advanced Photonic Sensors and Applications
Robert A. Lieberman; Anand Krishna Asundi; Hiroshi Asanuma, Editor(s)

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