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Proceedings Paper

Long trace profiler survey results
Author(s): Steven C. Irick
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Paper Abstract

Today the Long Trace Profiler (LTP) is widely accepted as a viable way to measure X-ray mirrors, and at some institutions is the only instrument available for measuring long, high- curvature aspheres. Although some questions of absolute accuracy over the entire LTP measurement range remain unanswered, a comparison of LTPs can still be made to assess measurement variation. Recently a round robin survey of some LTPs within the United States has been made using a single set of mirrors. These mirrors were used to characterize the performance of an LTP over its advertised range of operation. The results of this survey are presented here.

Paper Details

Date Published: 11 November 1999
PDF: 8 pages
Proc. SPIE 3782, Optical Manufacturing and Testing III, (11 November 1999); doi: 10.1117/12.369237
Show Author Affiliations
Steven C. Irick, Lawrence Berkeley National Lab. (United States)

Published in SPIE Proceedings Vol. 3782:
Optical Manufacturing and Testing III
H. Philip Stahl, Editor(s)

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