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Proceedings Paper

Dual-axis microscanners for infrared camera
Author(s): Chai Lay Lee
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Paper Abstract

Loss of image information is a profound problem with conventional IR cameras using focal plane array (FPA) technology. This is due to the limitation of semiconductor fabrication technology which results in ineffective are between the cells of the FPA detector. In this project, dual axis microscanners have been developed to capture the undetected image, as a result, improving the overall image resolution of the IR cameras.

Paper Details

Date Published: 4 November 1999
PDF: 8 pages
Proc. SPIE 3898, Photonic Systems and Applications in Defense and Manufacturing, (4 November 1999); doi: 10.1117/12.368512
Show Author Affiliations
Chai Lay Lee, Chartered Electro-Optics Pte Ltd. (Singapore)

Published in SPIE Proceedings Vol. 3898:
Photonic Systems and Applications in Defense and Manufacturing
Yee Loy Lam; Koji Ikuta; Metin S. Mangir, Editor(s)

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