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Proceedings Paper

Detector array system on a single silicon chip: uniformity correction
Author(s): Keith Birkinshaw; Dinesh J. Narayan; David P. Langstaff; G. Neville Greaves
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Paper Abstract

This paper presents work done using a detector array integrated on a single silicon chip and shows its physical characteristics and performance. The emphasis here is on array uniformity and the accurate measure of incident intensities. All arrays suffer non-uniformity to some extent due to manufacturing tolerances. The influence of this on measured data is considered and two approaches to correction are presented: (1) It is shown that spectra built up by measurement of single events can yield accurate peak intensities and positions. (2) Where spectra are measured in the normal way by summing many events before readout (higher dynamic range) a correction for non-uniformity is desirable. A new correction algorithm is illustrated.

Paper Details

Date Published: 6 October 1999
PDF: 8 pages
Proc. SPIE 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, (6 October 1999); doi: 10.1117/12.367123
Show Author Affiliations
Keith Birkinshaw, Univ. of Wales/Aberystwyth (United Kingdom)
Dinesh J. Narayan, Univ. of Wales/Aberystwyth (United Kingdom)
David P. Langstaff, Univ. of Wales/Aberystwyth (United Kingdom)
G. Neville Greaves, Univ. of Wales/Aberystwyth (United Kingdom)


Published in SPIE Proceedings Vol. 3774:
Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
George W. Fraser; Edwin M. Westbrook; Gareth E. Derbyshire, Editor(s)

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