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Proceedings Paper

Wavelet processing of interferometric signals and fringe patterns
Author(s): Michel Cherbuliez; Pierre M. Jacquot; Xavier Colonna de Lega
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Paper Abstract

The measurement of shape, displacement and deformations is often performed using interferometric methods, featuring nm to mm sensitivities and very high spatial and temporal resolutions. We first give a brief overview of interferometric techniques. Emphasis is laid on the wide purposes of these techniques. Then, we present a novel method using wavelet analysis to process live interference patterns. Further developments of the method are then presented. Finally, through two practical examples, we intend to highlight the interest of fringe processing by wavelet transform.

Paper Details

Date Published: 26 October 1999
PDF: 11 pages
Proc. SPIE 3813, Wavelet Applications in Signal and Image Processing VII, (26 October 1999); doi: 10.1117/12.366825
Show Author Affiliations
Michel Cherbuliez, Swiss Federal Institute of Technology (EPFL) (Switzerland)
Pierre M. Jacquot, Swiss Federal Institute of Technology (EPFL) (Switzerland)
Xavier Colonna de Lega, Zygo Corp. (United States)

Published in SPIE Proceedings Vol. 3813:
Wavelet Applications in Signal and Image Processing VII
Michael A. Unser; Akram Aldroubi; Andrew F. Laine, Editor(s)

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