Share Email Print

Proceedings Paper

Multidetector hemispherical polarized optical scattering instrument
Author(s): Thomas A. Germer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A multidetector optical scattering instrument is described and characterized. The instrument has twenty-eight detectors surrounding and substantially covering the scattering hemisphere. Each detector contains a polarizer so that each is only sensitive to p-polarized scattered light. The polarization of the incident light is linear and can be rotated into any angle. With this instrument, polarized light scattering measurements can be performed in multiple directions at once. The utility of this instrument is demonstrated by measuring the light scattered from a microrough silicon sample and silicon surfaces containing different sizes of polystyrene latex spheres. The results are compared to the predictions of theoretical calculations. It is shown that the distribution of polarization parameters for each of the different sizes of spheres and for microroughness are different. It is expected that designs similar to the one presented here will allow for improved on-line characterization of defects on smooth surfaces.

Paper Details

Date Published: 25 October 1999
PDF: 10 pages
Proc. SPIE 3784, Rough Surface Scattering and Contamination, (25 October 1999); doi: 10.1117/12.366713
Show Author Affiliations
Thomas A. Germer, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 3784:
Rough Surface Scattering and Contamination
Zu-Han Gu; Philip T. C. Chen; Zu-Han Gu; Alexei A. Maradudin; Alexei A. Maradudin, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?