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Proceedings Paper

XUV laser reflectometry for optical constant determination
Author(s): Igor A. Artioukov; Brady R. Benware; Jorge J. G. Rocca; Matt Forsythe; Yurii A. Uspenskii; Alexander V. Vinogradov
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Paper Abstract

We report the measurement of the optical constants of Si, GaP, InP, GaAs, GaAsP and Ir at a wavelength of 46.9 nm (26.5 eV). The optical constants were obtained from the measurement of the variation of the reflectivity as a function of angle utilizing, as an illumination source, a discharge pumped 46.9 nm table-top laser operated at a repetition rate of 1 Hz. These measurements constitute the first application of an ultrashort wavelength laser to materials research.

Paper Details

Date Published: 21 October 1999
PDF: 8 pages
Proc. SPIE 3776, Soft X-Ray Lasers and Applications III, (21 October 1999); doi: 10.1117/12.366672
Show Author Affiliations
Igor A. Artioukov, P.N. Lebedev Physical Institute (Russia)
Brady R. Benware, Colorado State Univ. (United States)
Jorge J. G. Rocca, Colorado State Univ. (United States)
Matt Forsythe, Colorado State Univ. (United States)
Yurii A. Uspenskii, P.N. Lebedev Physical Institute (Russia)
Alexander V. Vinogradov, P.N. Lebedev Physical Institute (Russia)

Published in SPIE Proceedings Vol. 3776:
Soft X-Ray Lasers and Applications III
Jorge J. G. Rocca; Luiz Barroca Da Silva, Editor(s)

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