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Proceedings Paper

High-flux x-ray response of composite mercuric iodide detectors
Author(s): Michael M. Schieber; Asaf Zuck; Leonid Melekhov; Rubil Shatunovsky; Haim Hermon; Renato A. D. Turchetta
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Paper Abstract

A theological model is presented which analyses the sensitivity of composite detectors to a flux of x-rays emerging form a radiological x-ray generator. The model describes the many factor which influenced the x-ray response, for the case where the detector is composed of several layers of crystallites separated by a polymeric glue as is the case of composite HgI2 detectors fabricated by the screen print method. The model also describes the variation of the sensitivity with grain size and dielectric constant, taking into account the dielectric constant of the binder showing also the experimental result. Finally, the experimental result of the sensitivity vs. the voltage is shown for single crystal and composite HgI2 detectors and these results are compared with polycrystalline PbI2 and a-Se, which are the main material candidates for medical digital radiology.

Paper Details

Date Published: 19 October 1999
PDF: 14 pages
Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); doi: 10.1117/12.366594
Show Author Affiliations
Michael M. Schieber, The Hebrew Univ. of Jerusalem and Sandia National Labs. (Israel)
Asaf Zuck, The Hebrew Univ. of Jerusalem (Israel)
Leonid Melekhov, The Hebrew Univ. of Jerusalem (Israel)
Rubil Shatunovsky, Real-time Radiography Readout (Israel)
Haim Hermon, Real-time Radiography Readout (Israel)
Renato A. D. Turchetta, Univ. Louis Pasteur (United Kingdom)

Published in SPIE Proceedings Vol. 3768:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics
Ralph B. James; Richard C. Schirato, Editor(s)

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