Share Email Print

Proceedings Paper

Influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera
Author(s): Josef Pal; Markus Kuster; Eckhard Kendziorra; Norbert Krause
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The European X-ray satellite XMM will be launched in December 1999. One of the focal plane instruments of the European Photon Imaging Camera (EPIC) on board XMM is equipped with a monolithic pn-CCD consisting of 12 individual CCDs with 200 X 64 pixels each. In order to exploit the god intrinsic energy resolution of the pn-CCD, the charge transfer efficiency (CTE) must be well known. Impurities in the wafer material act as traps for electrons, thus removing a fraction of the signal charge at each transfer step towards the readout anode. Electronics generated by optical light from the observed source or other optical sources may well saturate those traps, which results in a different CTE for x-ray generated charge packets. Using single CCDs of flight type, we have analyzed in our test facility at the Institut fuer Astronomie und Astrophysik der Universitaet Tuebingen, the influence of optical light on the CTE of the pn-CCD. In this paper we describe the result of our investigation of the CTE at different x-ray energies and varying optical light intensities.

Paper Details

Date Published: 22 October 1999
PDF: 10 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366549
Show Author Affiliations
Josef Pal, Eberhard-Karls-Univ. Tuebingen (Germany)
Markus Kuster, Eberhard-Karls-Univ. Tuebingen (Germany)
Eckhard Kendziorra, Eberhard-Karls-Univ. Tuebingen (Germany)
Norbert Krause, Max-Planck-Institut fuer Extraterrestrische Physik (Australia)

Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?