Proceedings Paper
Cryogenic microcalorimeters for high-resolution energy-dispersive x-ray spectrometry| Format | Member Price | Non-Member Price |
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Paper Abstract
We are developing both superconducting tunnel junctions and phase transition thermometers for high resolution x-ray spectroscopy. A resolution of 12 eV has been achieved for aluminum tunnel junctions when irradiated by 5.9 keV x-rays. These devices show linear energy response in the range between 200 eV and 6.5 keV. Phase transition thermometers consisting of an iridium/gold bi-layer and a gold absorber gave a resolution of 15.5 eV at 5.9 keV. The application of both sensor types is facilitated considerably by the use of an ADR cryostat. This mobile system allowed to characterize tunnel junctions at the Bessy I synchrotron.
Paper Details
Date Published: 22 October 1999
PDF: 6 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366543
Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)
PDF: 6 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366543
Show Author Affiliations
Godehard Angloher, Technische Univ. Muenchen (Germany)
Michael Altmann, Technische Univ. Muenchen (Germany)
Matthias Buehler, Cryogenic Spectrometers GmbH (Germany)
Franz von Feilitzsch, Technische Univ. Muenchen (Germany)
Theo Hertrich, Cryogenic Spectrometers GmbH (Germany)
Paul Hettl, Technische Univ. Muenchen (Germany)
Michael Altmann, Technische Univ. Muenchen (Germany)
Matthias Buehler, Cryogenic Spectrometers GmbH (Germany)
Franz von Feilitzsch, Technische Univ. Muenchen (Germany)
Theo Hertrich, Cryogenic Spectrometers GmbH (Germany)
Paul Hettl, Technische Univ. Muenchen (Germany)
Jens Hoehne, Cryogenic Spectrometers GmbH (Germany)
Michael Huber, Technische Univ. Muenchen (Germany)
Josef Jochum, Technische Univ. Muenchen (Germany)
Rudolf Moessbauer, Technische Univ. Muenchen (Germany)
Johann Schnagl, Technische Univ. Muenchen (Germany)
Stefanie Waenninger, Technische Univ. Muenchen (Germany)
Michael Huber, Technische Univ. Muenchen (Germany)
Josef Jochum, Technische Univ. Muenchen (Germany)
Rudolf Moessbauer, Technische Univ. Muenchen (Germany)
Johann Schnagl, Technische Univ. Muenchen (Germany)
Stefanie Waenninger, Technische Univ. Muenchen (Germany)
Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)
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