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Proceedings Paper

Improving the high-energy sensitivity of x-ray CCDs
Author(s): Adam Keay; Andrew D. Holland; David J. Burt
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Paper Abstract

We present a method of improving the quantum efficiency of MOS CCDs. We show that a change of operation can increase the depletion depth of standard bulk devices. The conclusions point to a point to a potential increase in the depletion depth of 300 percent by the use of optimized materials and operating conditions.

Paper Details

Date Published: 22 October 1999
PDF: 9 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366540
Show Author Affiliations
Adam Keay, Univ. of Leicester (United Kingdom)
Andrew D. Holland, Univ. of Leicester (United Kingdom)
David J. Burt, EEV Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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