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Proceedings Paper

PSF modeling of the XMM flight mirror modules
Author(s): Yvan Stockman; Yvette Houbrechts; Y. Naze; Pierre P. Rochus; Jean Philippe Tock; Philippe Gondoin
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Paper Abstract

In the frame of XMM testing, all the mirror modules have been illuminated by a vertical EUV collimated beam a the Centre Spatial de Liege. A mirror module consists in 58 co- focal and co-axial Wolter I mirrors. Up to now the images obtained at CSL have been used to assess the Mirror Module optical performances in a flight representative configuration, and also to verify the impact of the thermal environmental and vibration test on the optical performance. Due to the highly complex design of the Mirror Modules, simulating XMM images in details is very difficult. The Point Spread Function of some of the mirror modules presents slight asymmetry. In the facility design study, it has been demonstrated that the diffraction impact at 58.4 nm is negligible with respect to the half energy width mirror module specification. Presently all the mirror modules are better than 165 arcsec. This paper presents first the diffraction contribution on the image. In a second step a point spread function is built by using the metrological mirror shell data. EUV images are then analyzed to evaluate the impact of the mirror interface structure integration process on the PSF. An analytical model of the measured EUV pSF is developed. The modelization technique is applied to simulate in-orbit image. Finally the different modelizations are evaluated and compared.

Paper Details

Date Published: 22 October 1999
PDF: 11 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366508
Show Author Affiliations
Yvan Stockman, Univ. de Liege (Belgium)
Yvette Houbrechts, Univ. de Liege (Belgium)
Y. Naze, Univ. de Liege (Belgium)
Pierre P. Rochus, Univ. de Liege (Belgium)
Jean Philippe Tock, Univ. de Liege (Belgium)
Philippe Gondoin, European Space Agency/ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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