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Proceedings Paper

ASTRO-E/XRS calibration program and results
Author(s): Keith C. Gendreau; Michael Damian Audley; Keith A. Arnaud; Kevin R. Boyce; Ryuichi Fujimoto; Yoshitaka Ishisaki; Richard L. Kelley; Tatehiro Mihara; Kazuhisa Mitsuda; Frederick Scott Porter; Caroline Kilbourn Stahle; Andrew E. Szymkowiak
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Paper Abstract

XRS is the microcalorimeter x-ray detector aboard the US- Japanese ASTRO-E observatory, which is scheduled to be launched in early 2000. XRS is a high resolution spectrometer - with less than 9 eV resolution at 3 keV and better than 14 eV resolution over its bandpass ranging from about 0.3 keV to 15 keV. Here we present the results of our first calibration of the XRS instrument. We describe the methods used to extract detailed information about the detection efficiency and spectral redistribution of the instrument. We also present comparisons of simulations and real data to test our detector models.

Paper Details

Date Published: 22 October 1999
PDF: 11 pages
Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366495
Show Author Affiliations
Keith C. Gendreau, Univ. of Maryland/College Park and NASA Goddard Space Flight Ctr. (United States)
Michael Damian Audley, Institute of Space and Astronautical Science (Japan)
Keith A. Arnaud, Univ. of Maryland/College Park and NASA Goddard Space Flight Ctr. (United States)
Kevin R. Boyce, NASA Goddard Space Flight Ctr. (United States)
Ryuichi Fujimoto, Institute of Space and Astronautical Science (Japan)
Yoshitaka Ishisaki, Tokyo Metropolitan Univ. (Japan)
Richard L. Kelley, NASA Goddard Space Flight Ctr. (United States)
Tatehiro Mihara, RIKEN-The Institute of Physical and Chemical Research (Japan)
Kazuhisa Mitsuda, Institute of Space and Astronautical Science (Japan)
Frederick Scott Porter, NASA Goddard Space Flight Ctr. (United States)
Caroline Kilbourn Stahle, NASA Goddard Space Flight Ctr. (United States)
Andrew E. Szymkowiak, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 3765:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X
Oswald H. W. Siegmund; Kathryn A. Flanagan, Editor(s)

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