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Proceedings Paper

Industrial applications of a high-sensitivity linear birefringence measurement system
Author(s): Baoliang Bob Wang; Theodore C. Oakberg; Paul Kadlec
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Paper Abstract

In this paper we introduce an instrument developed recently for measuring low level birefringence. Known as the Exicor system, this instrument has two detecting channels for measuring both the magnitude and orientation of linear birefringence in transparent optical materials. The Exicor system, employing a low birefringent photoelastic modulator (PEM), provides high level sensitivity of approximately 0.005 nm and good time resolution of < 2s per data point. We present applications of the Exicor system to a variety of otpical samples with industrial importance, including PEM optical elements, compact disc blanks, photomask blanks and other optical components.

Paper Details

Date Published: 25 October 1999
PDF: 7 pages
Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); doi: 10.1117/12.366330
Show Author Affiliations
Baoliang Bob Wang, Hinds Instruments, Inc. (United States)
Theodore C. Oakberg, Hinds Instruments, Inc. (United States)
Paul Kadlec, Hinds Instruments, Inc. (United States)

Published in SPIE Proceedings Vol. 3754:
Polarization: Measurement, Analysis, and Remote Sensing II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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