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Proceedings Paper

X-ray-sensitive CCD camera
Author(s): Andrew A. Krasnjuk; Vladimir J. Stenin; Sergei V. Larionov; Victor A. Shilin; Alexander A. Utenkov
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Paper Abstract

This paper describes the key features and performance data of a 1040(H) X 1160(V) pixels full-frame transfer CCD camera for use as an X-ray detector in X-ray material structure analysis and X-ray fluorescence for the in-situ detection of metals. To achieve good sensitivity at energies below 50 keV we have developed compact units based on VLSI programmable logic devices and intermediate digital signal processing. The analog image output may be displayed on the standard TV-monitor, and also processed and displayed by PC- based data acquisition system. The CCIR TV specification make possible to detect X-ray patterns with a 20 ms exposure times and X-ray intensity more than 5...8 nJ/cm2. The impulse synchronization mode set up exposure times of a few tens to a few hundreds of milliseconds with a proportional level of X-ray intensity with the time resolution 300 ms. Synchronization the imaging detector with X-ray source allows converting X-ray patterns with exposure times before 1 s.

Paper Details

Date Published: 19 October 1999
PDF: 7 pages
Proc. SPIE 3901, Photonics for Transportation, (19 October 1999); doi: 10.1117/12.365932
Show Author Affiliations
Andrew A. Krasnjuk, Moscow State Engineering-Physics Institute (Russia)
Vladimir J. Stenin, Moscow State Engineering-Physics Institute (Russia)
Sergei V. Larionov, Russian Foundation TOPEK (Russia)
Victor A. Shilin, Russian Foundation TOPEK (Russia)
Alexander A. Utenkov, Russian Foundation TOPEK (Russia)


Published in SPIE Proceedings Vol. 3901:
Photonics for Transportation
Vladimir G. Inozemtsev; Milos Klima; Victor A. Shilin, Editor(s)

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