Share Email Print

Proceedings Paper

Instrumentation for obtaining best-image surface in remote-sensing optoelectronic systems
Author(s): Alexandre I. Baklanov; Alexander S. Zabiyakin; Maxim V. Klushnikov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Instrumentation for high-precision in-flight focusing of on- board optoelectronic equipment is described. The first part of the paper gives an overview of the existing focusing techniques and describes their application for particular remote sensing task solutions. A comparison of different methods is made, the accuracy provided by each method is assessed and one of the best techniques--a contrast method-- is considered. This method is shown to provide high precision--5 micrometers or better. The second part describes a mathematical model of instrumentation using this method. It includes a diffraction modulation transfer function (MTF), an MTF related to optical system aberrations and an optical system defocusing MTF. The simulation results are shown and respective recommendations are given.

Paper Details

Date Published: 19 October 1999
PDF: 6 pages
Proc. SPIE 3901, Photonics for Transportation, (19 October 1999); doi: 10.1117/12.365929
Show Author Affiliations
Alexandre I. Baklanov, OPTECS Research Institute (Russia)
Alexander S. Zabiyakin, OPTECS Research Institute (Russia)
Maxim V. Klushnikov, Moscow Physical-Technical Institute (Russia)

Published in SPIE Proceedings Vol. 3901:
Photonics for Transportation
Vladimir G. Inozemtsev; Milos Klima; Victor A. Shilin, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?