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Proceedings Paper

Electronic speckle pattern shearing interferometry for displacement and vibration measurement
Author(s): E. A. Abd El-Ghafar; Hatem El-Ghandoor
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Paper Abstract

In this technique the speckle shear interferometer is combined with the electronic speckle pattern interferometry technique. Two pinholes of the same diameter 'a', separated by a distance 'd' is used to image through object through an imaging lens. The formed speckle pattern which is the resultant of mutual interference between the two speckle patterns formed by each pinhole, is modulated by a grid structure inside it. This pattern is imaged by a CCD camera combined with a reference beam through a beam splitter. The object under investigation is now photographed in its first state, without any deformation, and this signal is allowed to be stored in the computer as a data file. During the object vibration or deformation, a second signal is to be sorted on the same data filet. A fast Fourier transform has been used to add such tow signals and after processing the two overlapped signals data one can obtain the deformation suffered by the object in the form of interference fringes displaying such deformation.

Paper Details

Date Published: 28 September 1999
PDF: 8 pages
Proc. SPIE 3786, Optomechanical Engineering and Vibration Control, (28 September 1999); doi: 10.1117/12.363790
Show Author Affiliations
E. A. Abd El-Ghafar, Ain Shams Univ. (Egypt)
Hatem El-Ghandoor, Ain Shams Univ. (Egypt)

Published in SPIE Proceedings Vol. 3786:
Optomechanical Engineering and Vibration Control
Eddy A. Derby; Eddy A. Derby; Colin G. Gordon; Colin G. Gordon; Daniel Vukobratovich; Carl H. Zweben; Daniel Vukobratovich; Paul R. Yoder Jr.; Carl H. Zweben, Editor(s)

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