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Proceedings Paper

Fast 3D multiple fan-beam CT systems
Author(s): Adrian Kohlbrenner; Stefan Haemmerle; Andres Laib; Bruno Koller; Peter Ruegsegger
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Paper Abstract

Two fast, CCD-based three-dimensional CT scanners for in vivo applications have been developed. One is designed for small laboratory animals and has a voxel size of 20 micrometer, while the other, having a voxel size of 80 micrometer, is used for human examinations. Both instruments make use of a novel multiple fan-beam technique: radiation from a line-focus X-ray tube is divided into a stack of fan-beams by a 28 micrometer pitch foil collimator. The resulting wedge-shaped X-ray field is the key to the instrument's high scanning speed and allows to position the sample close to the X-ray source, which makes it possible to build compact CT systems. In contrast to cone- beam scanners, the multiple fan-beam scanner relies on standard fan-beam algorithms, thereby eliminating inaccuracies in the reconstruction process. The projections from one single rotation are acquired within 2 min and are subsequently reconstructed into a 1024 X 1024 X 255 voxel array. Hence a single rotation about the sample delivers a 3D image containing a quarter of a billion voxels. Such volumetric images are 6.6 mm in height and can be stacked on top of each other. An area CCD sensor bonded to a fiber-optic light guide acts as a detector. Since no image intensifier, conventional optics or tapers are used throughout the system, the image is virtually distortion free. The scanner's high scanning speed and high resolution at moderately low radiation dose are the basis for reliable time serial measurements and analyses.

Paper Details

Date Published: 22 September 1999
PDF: 11 pages
Proc. SPIE 3772, Developments in X-Ray Tomography II, (22 September 1999); doi: 10.1117/12.363738
Show Author Affiliations
Adrian Kohlbrenner, Univ. of Zurich and Swiss Federal Institute of Technology (Switzerland)
Stefan Haemmerle, Scanco Medical AG (Switzerland)
Andres Laib, Univ. of Zurich and Swiss Federal Institute of Technology (Switzerland)
Bruno Koller, Scanco Medical AG (Switzerland)
Peter Ruegsegger, Univ. of Zurich and Swiss Federal Institute of Technology (Switzerland)

Published in SPIE Proceedings Vol. 3772:
Developments in X-Ray Tomography II
Ulrich Bonse, Editor(s)

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