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Proceedings Paper

New developments in attenuation and phase-contrast microtomography using synchrotron radiation with low and high photon energies
Author(s): Felix Beckmann; Ulrich Bonse; Theodor Biermann
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Paper Abstract

Microtomography using synchrotron radiation is widely used in fields of e.g. medicine, biology and material science. Using attenuation contrast at photon energies in the range of 8 to 25 keV and phase contrast at photon energies of 12 keV, 20 keV and 24 keV the method of microtomography is applied to a large number of samples. A comparison of the two different contrast mechanism is presented. Feasibility, advantage and limits of these methods are shown in theory and by experiment. New developments in high-energy microtomography using synchrotron radiation in the energy range of 60 to 100 keV are described. Using attenuation contrast, several samples are investigated. For the investigation of larger specimens with diameters on the order of 1 - 2 cm, the use of a new (mu) CT-technique based on scanning a 2-dim. X-ray detector is demonstrated. At 70 keV photon energy an X-ray LLL-interferometer is tested and used to measure phase projections. For the first time, phase- contrast microtomography could be applied to weakly and normally absorbing material at a high photon energy.

Paper Details

Date Published: 22 September 1999
PDF: 9 pages
Proc. SPIE 3772, Developments in X-Ray Tomography II, (22 September 1999); doi: 10.1117/12.363719
Show Author Affiliations
Felix Beckmann, DESY (Germany)
Ulrich Bonse, Univ. of Dortmund (Germany)
Theodor Biermann, Univ. of Dortmund (Germany)

Published in SPIE Proceedings Vol. 3772:
Developments in X-Ray Tomography II
Ulrich Bonse, Editor(s)

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