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Proceedings Paper

Effect of pitch in multislice spiral/helical CT
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Paper Abstract

To understand the effect of pitch on raw data interpolation in multi-slice spiral/helical CT, and provide guidelines for scanner design and protocol optimization. Multi-slice spiral CT is mainly characterized by the three parameters: the number of detector arrays, the detector collimation, and the table increment per X-ray source rotation. The pitch in multi-slice spiral CT is defined as the ratio of the table increment over the detector collimation. In parallel to the current framework for studying longitudinal image resolution, the central fan- beam rays of direct and opposite directions are considered, assuming a narrow cone-beam angle. Generally speaking, sampling in the Radon domain by the direct and opposite central rays is non-uniform along the longitudinal axis. Using a recently developed methodology for quantifying the sensitivity of signal reconstruction from non-uniformly sampled finite points, the effect of pitch on raw data interpolation is analyzed in multi-slice spiral CT. Unlike single-slice spiral CT, in which image quality deceases monotonically as the pitch increases, the sensitivity of raw data interpolation in multi-slice spiral CT increases in an alternating way as the pitch increases, suggesting that image quality does not decrease monotonically in this case. The most favorable pitch can be found from the sensitivity-pitch plot for any given set of multi-slice spiral CT parameters. An example for four-slice spiral CT is provided. The study on the pitch effect using the sensitivity analysis approach reveals the fundamental characteristics of raw data interpolation in multi-slice spiral CT, and gives insights into interaction between pitch and image quality. These results may be valuable for design of multi-slice spiral CT scanners and imaging protocol optimization in clinical applications.

Paper Details

Date Published: 22 September 1999
PDF: 12 pages
Proc. SPIE 3772, Developments in X-Ray Tomography II, (22 September 1999); doi: 10.1117/12.363713
Show Author Affiliations
Ge Wang, Univ. of Iowa (United States)
Michael W. Vannier M.D., Univ. of Iowa (United States)

Published in SPIE Proceedings Vol. 3772:
Developments in X-Ray Tomography II
Ulrich Bonse, Editor(s)

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