Share Email Print

Proceedings Paper

New methodology to baseline and match AME polysilicon etcher using advanced diagnostic tools
Author(s): James Poppe; John Shipman; Barbara E. Reinhardt; Myriam Roussel; Raymond Hedgecock; Arturo Fonda
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

As process controls tighten in the semiconductor industry, the need to understand the variables that determine system performance become more important. For plasma etch systems, process success depends on the control of key parameters such as: vacuum integrity, pressure, gas flows, and RF power. It is imperative to baseline, monitor, and control these variables. This paper presents an overview of the methods and tools used by Motorola BMC fabrication facility to characterize an Applied Materials polysilicon etcher. Tool performance data obtained from our traditional measurement techniques are limited in their scope and do not provide a complete picture of the ultimate tool performance. Presently the BMC traditional characterization tools provide a snapshot of the static operation of the equipment under test (EUT); however, complete evaluation of the dynamic performance cannot be monitored without the aid of specialized diagnostic equipment. To provide us with a complete system baseline evaluation of the polysilicon etcher, three diagnostic tools were utilized: Lucas Labs Vacuum Diagnostic System, Residual Gas Analyzer, and the ENI Voltage/Impedance Probe. The diagnostic methodology used to baseline and match key parameters of qualified production equipment has had an immense impact on other equipment characterization in the facility. It has resulted in reduced cycle time for new equipment introduction as well.

Paper Details

Date Published: 3 September 1999
PDF: 11 pages
Proc. SPIE 3882, Process, Equipment, and Materials Control in Integrated Circuit Manufacturing V, (3 September 1999); doi: 10.1117/12.361320
Show Author Affiliations
James Poppe, Motorola, Inc. (United States)
John Shipman, Aspect Systems (United States)
Barbara E. Reinhardt, Motorola, Inc. (United States)
Myriam Roussel, Motorola, Inc. (United States)
Raymond Hedgecock, Broadway Engineering Services Team (United States)
Arturo Fonda, Motorola, Inc. (United States)

Published in SPIE Proceedings Vol. 3882:
Process, Equipment, and Materials Control in Integrated Circuit Manufacturing V
Anthony J. Toprac; Kim Dang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?