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Proceedings Paper

SLIOS: a contribution to standard procedures in stray light measurements
Author(s): Stefan M. B. Baumer; Angela Duparre; Thomas Herrmann; Uwe Schumann; Kees Smorenburg; Volker Kirschner; Lars H. Mattsson; Teresita B. Quinteros; Richard Berglind; Stefan Schippel
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Paper Abstract

Light scattering measurements are important tools for characterizing optical surfaces can basically be divided into two main groups: total scatter measurements (TS) and Angle Resolved Scattering (ARS). Since TS measurements are fairly straight forward and widely used, international standardization has formulated an international draft standard on it, ISO/DIS 13696. ARS is a more complex method and not as common as TS measurements. However ARS data in form of the Bi-directional Reflectance Distribution FUnction (BRDF) can be used to predict stray light in Laser and Industrial Optical Systems. Because of increasing importance of this topic the EC is sponsoring a project regarding 'Standard procedures for stray light specification, measurement and testing - SLIOS'. During the project two of the activities are: performing a round robin experiment of measuring BRDF data at 5 different sites including some complementary techniques; compiling of an open access data base of measured BRDF data, measured according to procedures agreed upon between the SLIOS partners and proposed for 'Standard Procedures'. Results of these two activities will be presented.

Paper Details

Date Published: 6 September 1999
PDF: 8 pages
Proc. SPIE 3739, Optical Fabrication and Testing, (6 September 1999); doi: 10.1117/12.360173
Show Author Affiliations
Stefan M. B. Baumer, Philips Ctr. for Manufacturing Technology (Netherlands)
Angela Duparre, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Thomas Herrmann, Jenoptik LOS (Germany)
Uwe Schumann, Jenoptik LOS (Germany)
Kees Smorenburg, TNO/TPD (Netherlands)
Volker Kirschner, TNO/TPD (Germany)
Lars H. Mattsson, Institute of Optical Research (Sweden)
Teresita B. Quinteros, Institute of Optical Research (Sweden)
Richard Berglind, Institute of Optical Research (Sweden)
Stefan Schippel, Layertec GmbH (Germany)

Published in SPIE Proceedings Vol. 3739:
Optical Fabrication and Testing
Roland Geyl; Jonathan Maxwell, Editor(s)

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