Share Email Print

Proceedings Paper

New interferometric method for the complete determination of the properties of the light field scattered by a rough surface
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Total integrated scattering (TIS) and bi-directional reflectance distribution function measurements give information on the mean roughness of the surface and on the modulus of the Fourier Transform of the 2D surface profile. To obtain a more precise description of a rough surface and to get an estimation of the relative contribution of surface and volume scattering in multilayers stack, we have developed a new interferometric method which allows us to measure the variation of the phase of the Fourier Transform of the surface profile as a function of the scattering angle. This paper includes a detailed presentation of this method, a description of the experimental set-up used for its principle validation, as well as some preliminary results that we have obtained with it on high reflectance samples.

Paper Details

Date Published: 7 September 1999
PDF: 6 pages
Proc. SPIE 3738, Advances in Optical Interference Coatings, (7 September 1999); doi: 10.1117/12.360104
Show Author Affiliations
Michel Lequime, Ecole Nationale Superieure de Physique de Marseille (France)
Nathalie Destouches, Ecole Nationale Superieure de Physique de Marseille (France)
Hugues Giovannini, Ecole Nationale Superieure de Physique de Marseille (France)

Published in SPIE Proceedings Vol. 3738:
Advances in Optical Interference Coatings
Claude Amra; H. Angus Macleod, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?