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Proceedings Paper

Imaging-eclipsing-Z-scan method for measurement of the nonlinear refractive index of materials
Author(s): Mehrdad Mohebi; Nooshin Jamasbi; Omar Morales; Jesus Garduno; Ali A. Said; Eric W. Van Stryland
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Paper Abstract

We present a new variation of the Z-scan technique, which provides a sensitive method for measurement of the nonlinear refractive index of materials. The method is based on imaging of a top hat beam onto a blocking disk; therefore, it is very sensitive. In addition to greater sensitivity the method offers the advantage that it does not require a Gaussian beam, therefore it can be used with low energy lasers with any beam profile.

Paper Details

Date Published: 6 July 1999
PDF: 4 pages
Proc. SPIE 3572, 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications, (6 July 1999); doi: 10.1117/12.358373
Show Author Affiliations
Mehrdad Mohebi, CICESE (United States)
Nooshin Jamasbi, CICESE (Mexico)
Omar Morales, CICESE (Mexico)
Jesus Garduno, CICESE (United States)
Ali A. Said, Univ. of Michigan (United States)
Eric W. Van Stryland, CREOL/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 3572:
3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications
Angela Maria Guzman, Editor(s)

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