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Proceedings Paper

Digital moire subtraction applied to interferometers as a means of improving accuracy and extending field of view for engineering and optical measurement
Author(s): Colin Forno; Maurice Patrick Whelan
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Paper Abstract

Interferometers are used for routinely testing optical components and in engineering for the measurement of mechanical and thermal behavior of materials and components. Conventionally, for the most accurate measurements these interferometer systems are constructed from high-quality optical elements and include fine controls for precise alignment. In this new approach, all the errors of a poor quality, misaligned system are accepted then eliminated by a simple digital subtraction process. The method offers the possibility of devising very large aperture optical systems for traditional and engineering interferometers from inexpensive and basic components.

Paper Details

Date Published: 17 August 1999
PDF: 9 pages
Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); doi: 10.1117/12.357806
Show Author Affiliations
Colin Forno, European Commission Joint Research Ctr. (United Kingdom)
Maurice Patrick Whelan, European Commission Joint Research Ctr. (Italy)

Published in SPIE Proceedings Vol. 3745:
Interferometry '99: Applications
Werner P. O. Jueptner; Krzysztof Patorski, Editor(s)

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